{"id":188,"date":"2024-07-22T11:29:26","date_gmt":"2024-07-22T02:29:26","guid":{"rendered":"https:\/\/www.suicte.com\/?page_id=188"},"modified":"2024-09-06T15:06:32","modified_gmt":"2024-09-06T06:06:32","slug":"suicte%e3%81%ae%e6%8a%80%e8%a1%93","status":"publish","type":"page","link":"https:\/\/www.suicte.com\/?page_id=188","title":{"rendered":"Introduction for our CMOS Image Sensor Technologies"},"content":{"rendered":"\n

A Chairman's Introduction<\/strong><\/h2>\n\n\n\n

Shoji Kawahito at a professor of Shizuoka Univ. he is an image sensor expert and also a chairman of SUiCTE and is co-developing various kinds of new image sensors upon requests from companies, to realize their requirements, w\/ a lot of his knowledges, experiences and patents.<\/p>\n\n\n\n

SUiCTE\u2019s \u201cROLE\u201d
 Is to quickly commercialize these of development projects.
We have a Joint Research and Development Agreement w\/ Shizuoka niv.   and have well experienced engineers such as pixel,   analog\/digital circuit, system and evaluation and analysis. <\/p>\n\n\n\n

Sensor Technologies<\/strong><\/h2>\n\n\n\n

https:\/\/www.ite.or.jp\/contents\/venture\/1807venture.pdf<\/a> \u3000\u3000\u30002018 ITE<\/p>\n\n\n\n

https:\/\/ieeexplore.ieee.org\/document\/8310198<\/a> \u3000\u3000\u3000 2018 ISSCC<\/p>\n\n\n\n

Technologies for Image Sensor \u2160<\/strong><\/h2>\n\n\n\n
\"image_censor\"<\/figure>\n\n\n\n

<\/p>\n\n\n\n

<\/p>\n\n\n\n

<\/p>\n\n\n\n

<\/p>\n\n\n\n

Technologies for Image Sensor \u2161<\/strong><\/h2>\n\n\n\n

1) Pixel Design<\/strong><\/p>\n\n\n\n

\u2605 <\/strong>Optimization by considering many Trade-offs<\/strong><\/p>\n\n\n\n

\u2605 <\/strong>Global<\/strong> <\/strong>Shutter<\/strong><\/p>\n\n\n\n

\u2605 <\/strong>Time of Flight<\/strong><\/p>\n\n\n\n

     \u2192<\/strong>Customize<\/strong> <\/strong>Pixel<\/strong> <\/strong>with<\/strong> <\/strong>Foundry<\/strong><\/p>\n\n\n\n

2) Analog Design<\/strong><\/p>\n\n\n\n

    \u2605 Low noise Amplifier<\/strong><\/p>\n\n\n\n

    <\/strong>\u2605 <\/strong>High<\/strong> <\/strong>Speed<\/strong> <\/strong>ADC(A\/D<\/strong> <\/strong>Converter)<\/strong> <\/strong>= <\/strong>Cyclic<\/strong> <\/strong>ADC<\/strong><\/p>\n\n\n\n

\u3000\u3000\u3000\u3000\u3000\u3000       Cf.  Sony\/OVT  : Single Slope ADC  \u3000              <\/strong><\/p>\n\n\n\n

Aptina       : SAR ADC\u3000<\/strong><\/p>\n\n\n\n

Technologies for Image Sensor \u2162<\/strong><\/h2>\n\n\n\n

2-stage Column Parallel Cyclic A\/D Converter<\/strong><\/p>\n\n\n\n

\u3000\u30fbOptimize the topology of the basic 2-stage Cyclic A\/D Converter<\/strong><\/p>\n\n\n\n

\u3000\u30fbBrushed up the design for circuit and layout<\/strong><\/p>\n\n\n\n

\u3000\u3000High Speed (1MS\/s)<\/strong><\/p>\n\n\n\n

\u3000\u3000High Bit Resolution (12bit)<\/strong><\/p>\n\n\n\n

\u3000\u3000Low Power (<120uW\/ADC)<\/strong><\/p>\n\n\n\n

\"ADC\"<\/figure>\n\n\n\n

Correlated-Multiple-Sampling (CMS) 16b
A\/D Converter<\/strong><\/p>\n\n\n\n

\u25c6Our CMS-based cyclic ADC realizes ultra-low-noise wide-dynamic-range CMOS imagers for High-End DSC, Security Camera, Remote Sensing, etc.<\/strong> <\/p>\n\n\n\n

\u3000Ultra Low Noise (0.3e-*)<\/strong><\/p>\n\n\n\n

 \u3000High Bit Resolution (16bit)<\/strong><\/p>\n\n\n\n

 \u3000Wide Dynamic Range (>90dB)<\/strong><\/p>\n\n\n\n

\u3000High Conversion Gain Pixel\u00a0 is used.\u00a0<\/strong><\/p>\n\n\n\n

\"\"<\/figure>\n\n\n\n

<\/p>\n\n\n\n

Technical Papers for Image Sensor<\/strong><\/h2>\n\n\n\n

\u25c6 2017.02. ISSCC<\/p>\n\n\n\n

\u3000\u201cA 0.44e-rms Read-Noise 32fps 0.5Mpixel High-Sensitivity RG-Less- Pixel CMOS Image Sensor Using Bootstrapping Reset\u201d<\/p>\n\n\n\n

\u25c6 2016.02. ISSCC<\/p>\n\n\n\n

\u3000\u201cA 1.1\u03bcm 33Mpixel 240fps 3D-Stacked CMOS Image Sensor with 3-Stage Cyclic-Based Analog-to-Digital Converters\u201d<\/p>\n\n\n\n

\u25c6 2012.02. ISSCC<\/p>\n\n\n\n

\u3000\u201cA 33Mpixel 120fps CMOS Image Sensor Using 12b Column-Parallel Pipelined Cyclic ADCs\u201d<\/p>\n\n\n\n

\u25c6 2011.06. IISW<\/p>\n\n\n\n

\u3000\u201cA High Speed Low-Noise CIS with 12b 2-stage Pipeline Cyclic ADCs\u201d<\/p>\n\n\n\n

\u25c6 2011.06. IISW<\/p>\n\n\n\n

\u3000\u201cA 33Mpixel, 120fps CMOS Image Sensor for UDTV Application with Two-stage Column- Parallel Cyclic ADCs\u201d
<\/p>\n\n\n\n

Technologies for Time of Flight Sensor<\/strong> I<\/h2>\n\n\n\n

\u3000\u3000\u3000<\/p>\n\n\n\n

\"\"<\/figure>\n\n\n\n

<\/p>\n\n\n\n

Technical Papers for Time of Flight Sensor<\/strong><\/h2>\n\n\n\n

 2015.05. J-EDS<\/strong><\/p>\n\n\n\n

    \u201cA Time-of-Flight Range Image Sensor with Background Cancelling Lock-in Pixels Based on    Lateral Electric Field Charge Modulation\u201d,<\/p>\n\n\n\n

2016.01. Trans. on ED<\/strong><\/p>\n\n\n\n

     \u201cA Submillimeter Range Resolution Time-of-Flight Range Imager With Column-Wise Skew    Calibration\u201d<\/p>\n\n\n\n

2016.01. Trans. on ED<\/strong><\/p>\n\n\n\n

     \u201cA 10 ps Time-Resolution CMOS Image Sensor With Two-Tap True-CDS Lock-In Pixels for    Fluorescence Lifetime Imaging\u201d<\/p>\n\n\n\n

2014.08. Opt. Express<\/strong><\/p>\n\n\n\n

     \u201cIndirect time-of-flight measurement technique with impulse photocurrent response for sub- millimeter range resolved imaging\u201d<\/p>\n\n\n\n

2016.02. Opt. Express<\/strong><\/p>\n\n\n\n

     \u201cSingle-event transient imaging with an ultra-high-speed temporally compressive multi-aperture   CMOS image sensor\u201d<\/p>\n\n\n\n

<\/p>\n\n\n\n

Evaluation and Analysis Technologies<\/strong><\/h2>\n\n\n\n

We can provide your pixels characterization data as well as haracterization environment and method and also FA data and method w\/ OBRICH, SEM and TEM based on our rich experience.<\/p>\n\n\n\n

Design Experiences on Large field image sensor <\/h2>\n\n\n\n
    \n
  • Our strong point is Large format image sensor developments w\/ special purpose.<\/li>\n\n\n\n
  • We have developed more than 15 large field image sensors w\/ stitching on 0.11um CIS process in some foundry<\/li>\n\n\n\n
  • We have an Foundry expert who worked for some foundry for 15 year at technical support for Japanese customers on various processes include CIS processes.<\/li>\n<\/ul>\n\n\n\n

    \u25c6Flexible image sensor design is available on a Large field image sensor<\/strong><\/p>\n\n\n\n

    - Consideration for IR drop on bus lines.
    - Keep clock simultaneity on a chip everywhere.
    - Adjust many of High speed outputs data timing.
    - Control Pixels behavior at stitching area.
    - Ideas and experiences for large-field chip cost down and yield improvement.
    - Test program development is available by ourselves, we can use Shizuoka univ. testers for image sensor.
    - Failure analysis and short and log term reliability testing are also available.<\/p>\n\n\n\n

    <\/p>\n","protected":false},"excerpt":{"rendered":"

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